Review Conferences 2008

Experts presented their contributions at the
 
OPTO Conference 2008 
chaired by Prof. Dr. E. Wagner,
Fraunhofer Institute IPM, Freiburg,
 
IRS² Conference 2008 
chaired by Prof. Dr. G. Gerlach,
Technical University Dresden,
 
VDI/VDE Expert Forum 2008
chaired by Prof. Dr. W. Daum,
Bundesanstalt für Materialforschung und –prüfung (BAM), Berlin,
 
PTB Conference: Optical methods for flow measurement
chaired by Dr. A. Odin,
Physikalisch-Technische Bundesanstalt, Braunschweig,
 
Workshop on R&D Support Programmes
chaired by Dr. G. Tschulena,
sgt Sensorberatung Dr. Guido Tschulena, Wehrheim and
 
ITC Germany in cooperation with FLIR Systems GmbH, Frankfurt.

 

 

You may download the complete conference programme here:

SENSOR+TEST 2008 - Conference Programme

 

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