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The SENSOR+TEST trade fair in Nürnberg is the world's leading forum for sensors, measuring and testing. From simple microsensors to complex test rigs, from ready-to-use components to individualised services, the SENSOR+TEST represents the complete competence in measurement technology.
For the first time the conferences to the SENSOR+TEST will have a new stucture. Individual conferences will be held under the SENSOR+TEST Conference 2009 group:
SENSOR 2009
14th International Conference on Sensors, Technologies, Electronics and Applications
chaired by Prof. Dr. R. Werthschützky,
14th International Conference on Sensors, Technologies, Electronics and Applications
chaired by Prof. Dr. R. Werthschützky,
Fraunhofer Institute IPM, Freiburg and
Prof. Dr. R. Lerch, University Erlangen-Nürnberg,
OPTO 2009
Photonic Metrology
9th International Conference on Optical Technologies for Sensing and Measurement
chaired by Prof. Dr. E. Wagner,
Photonic Metrology
9th International Conference on Optical Technologies for Sensing and Measurement
chaired by Prof. Dr. E. Wagner,
Fraunhofer Institute IPM, Freiburg,
IRS² 2009
11th International Conference on Infrared Sensors and Systems
chaired by Prof. Dr. G. Gerlach,
11th International Conference on Infrared Sensors and Systems
chaired by Prof. Dr. G. Gerlach,
Technical University Dresden.
In addition to the SENSOR+TEST Conference 2009, further first class scientific conferences will take place, such as:
VDI/VDE Expert Forum 2008
chaired by Prof. Dr. W. Daum,
chaired by Prof. Dr. W. Daum,
Bundesanstalt für Materialforschung und –prüfung (BAM), Berlin.
